| PlasCon HCD 13.56 MHz hollow cathode plasma system
Applications:
- plasma-enhanced chemical vapor deposition (PE-CVD)
- plasma polymerisation
- surface modification
- plasma cleaning
- plasma etching
- reactive and non-reactive ion etching
- material science (in general)
features:
- planar HCD plasma
source (similar to HCD-P 100) producing high plasma and radical densities. 48 plasma jets arranged in a hexagonal matrix of 15 cm
in diameter,
- HCD plasma source
with proprietary compact gas distribution system (primary gas, monomer)
featuring fractal geometry gas channels,
- rf biased, water cooled substrate holder
to accomodate wafers of up to 5" diameter, to control the ion energy (resistively
heated susbtrate holder is available optionally),
- vacuum chamber design and gas distribution
system of the HCD plasma source optimized via computational flow dynamics (CFD)
simulation,
- synchronized rf-power coupling to the planar HCD plasma source and
substrate holder for better process stability and control,
- time-modulated power coupling for a more selective plasma chemistry
and plasma particle energy control.
Other important technical features of PlasCon HCD are :
- substrate holder can be moved vertically (chamber
vented) for easy loading and unloading by motorized stage
- vacuum system consisting of 250 m3/h
roots blower with rotary
backing pump, DN 63 ISO-K pumping port, special pumping ring geometry for an azimuthally
homogeneous gas flow,
- 4 flow controllers
(optionally up to 8), throttle valve and Baratron vacuum gauge for
independent pressure and flow control,
- all chamber, plasma source and substrate holder parts in contact with
the plasma are made of aluminum.
- vacuum chamber is equipped with five DN 40
KF vacuum ports for easy diagnostic access.
- Distance plasma source - substrate holder : 6 cm (standard), this distance can be increased by adding
distance rings of differernt heights
All chamber, plasma source and substrate holder parts in contact with
the plasma are made of aluminum, which has good thermal conductivity.
Furthermore, aluminum has a rather low surface loss rate of excited species
and raicals. The source can be operated isothermically by adjusting the
cooling water temperature.
Technical data:
HCD Plasma
source
and RF biasable substrate holder
Frequency: 13.56 MHz
RF-power (max):
700 W (HCD)
500 W
(substrate holder))
Matching:
automatic
Pressure range:
0.05 - 10 mbar
Gases:
process gas, monomer gas
Gas flow rates: > 500 sccm,
depending on pumping system
Plasma density
5 x 1011 cm-3 (Ar, 1
mbar)
Temperature
control: water cooled or controlled by thermo-controller
|
ICP-P 200
13.56 MHz RF inductively
coupled plasma source
Features
·
planar coil with 200 mm diameter
·
extended power range
·
low ion energy with narrow energy spread
·
high plasma and radical densities
·
compatible with chemically reactive and non reactive gases
·
cw and pulsed operation
·
low contamination
Applications
·
plasma enhanced chemical vapor deposition (PE-CVD)
·
surface modification
·
plasma cleaning
·
plasma etching
·
reactive and non reactive ion etching
·
material science (in general)
General
Plasma-based materials
processing including applications in semiconductor and micro system
technology often require high densities (> 1011 cm-3)
of electrically charged (ions, electrons) and uncharged particles such as
excited species and radicals. Additionally, a good plasma uniformity over
larger diameters (ł
200 mm) is required. In certain applications one is also interested in low
ion energies (< 20 eV) in order to avoid substrate damage.
A promising and relatively
simple method to produce such plasmas is an inductively coupled plasma (ICP)
consisting of a planar, multi-turn spiral coil antenna, coupling an rf
(13.56 MHz) field through a dielectric window (quartz) into the plasma
chamber. However, the up-scaling of a conventional ICP source using one
multi-turn spiral coil has limitations due to the increase of the inductance
with antenna diameter. The large inductance causes a large voltage drop
between the ends of the antenna and unstable impedance matching.
Additionally, the large voltage increases the capacitive coupling of the
antenna to the plasma causing a low-efficiency non-uniform plasma
production.
The antenna coil system of the
ICP-P 200 is designed to overcome the large induction problem. Firstly, a
novel four-antenna, low inductance (0.54
mH)
spiral coil is used that allows operation at lower rf voltage, since the
coils are electrically parallel to each other. Secondly, the antenna housing
that consist of a stainless steel cylinder and a quartz window is equipped
with an eddy current shielding, thus reducing the resistive losses of the
system. A uniform plasma at high density is produced without relying upon
external magnetic coils.
Time-modulated power coupling,
which can be extremely beneficial to a variety of plasma-induced etching and
deposition processes, can be performed with the ICP P 200 as well. Because
of the low antenna impedance, the capacitive coupling between antenna and
plasma is reduced and the transition between the dim capacitive discharge
mode (so called “E mode”) and the bright inductive mode (so called “H mode”)
occurs already at very low coil input powers even without a Faraday
shield.
Technical data
RF-power: 3 - 1200 W (cw),
in pulsed mode higher peak power is possible
Frequency 13.56 MHz
Pressure range: 0.25...100 Pa
Flange size : DN 250 ISO-K or
larger, CF flange optionally
Gas flow rate: depends on the plasma
process
e.g.. 1- 50 sccm argon, 1 - 20 sccm oxygen
|
| ICP- PECVD
Features
·
ICP plasma source with high plasma and radical densities
·
Excellent thickness uniformity
·
Compatible with chemically reactive and non reactive gases
·
Low electron temperature
·
Custom design on request
Applications
·
Scratch resistant transparent coatings
·
Photosensitive and electronically active layers
·
Dielectric layers
·
Thin film transistors
·
Chemical resistant layers
·
Plasma etching
·
Plasma cleaning
The
PlasmaConsult
ICP-PECVD System consists of six main components:
· ICP-P 200 plasma source with integrated rf matching unit
mounted on a DN 250 ISO-K flange and a 1000 W 1310 RF (13.56 MHz) power
generator.
· heated substrate holder BSH 150 mounted on a DN 250 ISO-K
flange an a digital PID temperature controller.
· main vacuum chamber incl. gas rings for the monomer and working gas and a
remote grid.
· load lock system with a magnetically coupled transporter and a separate
rotary vane pump and Pirani type pressure gauge.
· pumping system consisting of a turbo molecular pump and two stage rotary
vane pump as forevacuum pump.
· gas distribution system incl. four mass flow controllers and read out unit.
Technical data
ICP rf power range:
3 - 1000 W (cw)
ICP frequency:
13.56 MHz
ICP pressure range:
0.25 -100 Pa
Temp. substrate holder:
max. 500°C
dc bias substrate holder:
max +/- 500 V
max. wafer size:
6"
Base pressure:
<10-5
mbar
|
HCD-P 100
Features:
- operation over an extended power and pressure range
- no mode jumps
- high plasma and radical species densities with excellent
radial homgeneity
- compatible with chemical reactive and non-reactive gases
- cw and pulsed power operation
- low contamination
Applications:
- plasma-enhanced chemical vapor deposition (PE-CVD)
- plasma polymerisation
- surface modification
- plasma cleaning
- plasma etching
- reactive and non-reactive ion etching
- material science (in general)
Concept of
the HCD-P100
Hollow cathode discharges represent a relatively simple means for the
efficient production of high density, low temperature plasmas. The plasma source HCD-P 100
employs the hollow cathode effect. Basically, the source consists of a hexagonal matrix of
48 hollow cathode discharges. The inner hollow cylinders are rf-powered enclosing the
primary plasma; the outer part of the source is electrically grounded.
An hexagonal array of orifices is drilled into the housing and the hollow cylinders
allowing plasma jets to be extracted after the primary plasma has been excited in the
hollow cathode. A proprietary compact gas distribution system for the primary gas and the
monomer gas featuring fractal geometry gas channels plus a proprietary internal cathode
structure guaranties a homogenous jet formation over extended source dimensions.
The material used is all-aluminium important for a good thermal conductivity and reduced
surface loss rates when working with radicals and excited species. Depending on the
technological needs the whole system can be operated isothermally by adjusting the
cooling/heating water-temperature.
Performance
There are two major parameters controlling the performance and technical
applicability of hollow cathode plasma sources such as the HCD -P. These are the working
pressure range of the hollow cathode (primary) discharge and the rf-power required for
plasma breakdown, i.e. ignition.
Homogeneity
Issues
The achievable film homogeneity and quality in plasma polymerisation is
controlled by the substrate distance to the monomer inlet and jet-orifices (primary
plasma). Another important influence relates to the total gas flow patterns. Detailed
experimental investigations have shown that a distance of about 60 mm between the plasma
jet outlets and the substrate is a good compromise between the desired film homogeneity
and achievable deposition rates.
As an example for a low-temperature PE-CVD process with the HCD-P DLC-deposition on a
substrate has been performed. High quality DLC films were grown at room temperature with a
film uniformity better than 4 % across a 4" Si-wafer (substrate bias at 400 V). In summary, the HCD-P yields excellent homogeneities in plasma-induced surface
modifications/activations as well as in plasma polymerised thin films.
Contamination
It is commonly said that HCD's are prone to unwanted parasitic sputtering
of the source electrodes. Due to its proprietary and patented excitation geometry
PlasmaConsult's hollow cathode plasma sources HCD enclose the plasma completely with the
exception of the plasma jet holes. Any possible contamination must have its origin in the
inner cylinder or at the jet orifices.
From the source geometry it is highly unlikely that contaminants (in this case aluminium)
will leave the inner source and are deposited e.g. on a substrate.
In fact, after two hours of operation (300 sccm Ar, 1 mbar, 400 W), the surface
concentration of aluminium on a Si-wafer was found to be 0,25 % of the Si concentration
only.
Lifetime
The HCD-P is manufactured using exclusively aluminium and ceramic parts
for electrical insulation. No quartz windows etc. are necessary. Since all ceramic parts
are shielded from direct plasma interaction and sputtering the source is extremely robust
and offers extended lifetimes often superior to those of inductively and microwave excited
plasmas.
Technical data
RF-Power: 1 - 700 W 13.56 MHz
Mounting flanges: DN 250
ISO-K or larger, CF flange optionally
Cooling:
water
Pressure
range: 5 - 1000 Pa
Gas flow rates:
5 - 500 sccm (primary gas)
4 - 100 sccm (monomer / precursor gas )
|
|
Magnetron Sputter Coating System MSC-3
Features
-
Up to 4 water cooled magnetron sputter sources
-
Excellent thickness uniformity
-
Compatible with chemically reactive and non reactive gases
-
Rotateable and movable substrate holder
Custom
design on request
Applications
The
PlasmaConsult
Magnetron Sputter Coating System MSC-3 consists of five main components:
-
Up to four water cooled
planar 3” magnetron sputter sources mounted on a DN 400 ISO-K
flange and RF (13.56 MHz) or DC power
generator
-
The
main vacuum chamber incl. access door and vacuum inlet for the
working gases. The main vacuum chamber is equipped with vent valve and two
pressure gauges.
-
The
substrate holder mounted on a DN ISO-K flange, movable and
rotateable.
-
the
pumping system consisting of a turbo molecular pump and a two stage
rotary vane pump as forevacuum pump.
-
The
gas distribution system incl. two mass flow controllers and
electronic control unit
Technical data
Magnetron sputter sources
Max. power (DC)
1.250 W
Max. power (RF)
750 W
Pressure range:
3 x 10-3 - 10-1 mbar
Max. target size
3"
max. substrate size
4"
Base pressure:
<10-5
mbar
|
µ-SLAN
2.45
GHz microwave plasma
source
Features:
- high plasma and radical densities
- compatible with chemically reactive and nonreactive gases
- low contamination
- ECR operation optionally
- cw and pulsed operation
Applications:
- plasma-enhanced chemical vapor deposition (PE-CVD)
- surface modification
- plasma cleaning
- plasma etching
- reaktive and non-reactive ion etching
- basic reasearch in the material sciences
Working principle:
The SLAN basically consists of an annular wave guide (ring resonator)
with slot antennas positioned at regular intervals on the innner side feeding microwave
energy into the plasma. A magnetron which generates microwave power of 2.45 GHz frequency
couples to the SLAN via R 26 wave guide. Between the generator and the plasma load a three
port circulator directs the reflected power from the plasma into a water cooled dummy load
to protect the magnetron from possible damage. The microwaves are coupled by a moveable
antenna into the annular ring. Because of the highly nonlinear plasma impedance the active
antenna length as well as the plunger position can be adjusted for minimum reflected
power. A three stub tuner is not necessary. By changing the antenna and plunger position
virtually any plasma load for an extended power and pressure range can be handled for
atomic and molecular gases. Necessary calculations and simulations for construction were
done using the software package MAFIA from Computer
Simulation Technology (CST GmbH).
Electron
cyclotron resonance (ECR)
A permanent 875 G SmCo-magnet assembly can be inserted into the SLAN to
increase dramatically the power absorption in the lower pressure range at around 10-4
to 10-2 mbar. Ionization ratios of several percent (depending on the gas used)
thereby yielding maximum ion concentrations of the order of 10-11 cm-3
are typical. At the same time the electron temperature increases with decreasing pressure
approaching several eV.
Surface wave generation
The
mSLAN generates axial surface waves at higher power levels
(with argon in excess of 1 kW cw, with molecular gases higher power levels are necessary).
Perequisite is that the plasma is overdense which is easily achieved for Ar. When
operating in this mode the plasma volume increases with increasing power providing
interesting options for advanced materials processing.
Technical data:
µSLAN SLAN I
SLAN II
Plasma diameter 4 cm
16 cm 67 cm
max. mw power:
1,2 kW 2 kW 6
kW
working range
with ECR (mbar) 10-4
- 50 10-4 - 10
N/A
without ECR
10-2 - 50 10-2 - 10
10-2 - 2
pulsable
yes
yes
yes
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