The L2P is our efficient and reliable plasma characterization system to determine the important plasma parameters like the electron temperature, the plasma potential and others. It can be used in the single and the double probe mode. Learn more about the L2P system in our Tech Library.

The MWI 2650 (A) is the first affordable non-invasive plasma characterization system. It is a complement to the classical langmuir probe, especially for thin film deposition and etching plasmas. Learn more about the MWI system in our Tech Library.

Please click on the pictures for more information or call our specialist:

Dr. Dariusz Korzec, 0941/4090-9102

If you need further information about our product range please click here